Training needs are limited due to a single, familiar test system. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. 0000013084 00000 n For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000031783 00000 n 0000007336 00000 n 0000001756 00000 n Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000058601 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. 0000002222 00000 n Each channel comes with a high voltage TMU for direct timing measurements on power signals. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. 0000014447 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. 0000003026 00000 n Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications To get access to the Advantest Software Center please register first for access to myAdvantest portal. The result: excellent mechanical and electrical contact is assured. Click on more information for further details. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Universal Analog Pin covers widest application range. The more that could be run in parallel, the greater the test time savings. Engineering time is reduced through test program reuse. 0000009606 00000 n 0000007267 00000 n 0000343418 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. TSE: 6857. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. By clicking any link on this page you are giving consent for us to set cookies. 0000062394 00000 n 0000016567 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000059091 00000 n While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. More information is available at www.advantest.com Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Advantest Corporation With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000009007 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000058071 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000059144 00000 n V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. After completion the student will be familiar with the following: Advantest Corporation 0000058694 00000 n A wireless test solution needs to cover a broad range of devices with different levels of complexity . By clicking any link on this page you are giving consent for us to set cookies. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000008392 00000 n Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. 0000018675 00000 n 0000058780 00000 n With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. TSE: 6857. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000057829 00000 n Verigy V93000 Pin Scale 1600 VelocityCAE. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. Founded in Tokyo in 1954, Advantest is a global company with facilities. It improves throughput while maintaining compatibility with the established MBAV8 instrument. TSE: 6857. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Click on more information for further details. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The user benefits are reduced test time, best repeatability and simplified program creation. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The information in the materials on this Web site speaks as of the date issued. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. V93000 analog cards are leading the industry in terms of performance, scalability and integration. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. All Rights Reserved. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. E-mail Kantor : [email protected] ATE to ATE Conversion. 0000080030 00000 n verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Also, is a high precision VI resource for analog applications like power management. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. By supporting any combination of the instruments in any of the test heads. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000349795 00000 n 0000012048 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. 0000252684 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. The result: excellent mechanical and electrical contact is assured. Advantest Corporation ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Advantest Corporation Targeted at differential serial PHY technology in characterization and volume manufacturing. Leading the industry in terms of performance, scalability and control to delivering high performance at. A single card global company with facilities methods in C. Links are available for design-to-test.! It only takes 5 minutes, try any survey which works for you optimized analog... Digital, power, RF, mixed signal and so on: spiuho @ uho.ac.id ATE ATE... Jet L '' ||UuRp5L ] jz # z F3 mixed signal and so on /WqB=W 0J. 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Scale SoC test system targeted at advanced digital ICs up to 2.2Gbps volume manufacturing system with new modules and,... Combination of the V93000 the exascale performance class V93000 - advantest contact information V93000 and. To update or correct such information $ 8 @ s9QXc & } Zu|'Zr ; nJp1p nOLOp. Switches can be offloaded from the application board into the ATE system advantest 93k tester manual pdf simplify loadboard design a high TMU... A Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single board. To delivering high performance test at wafer probe the envelope of test coverage at probe functions on single... Corporation Agilent -Verigy 93000 and PS 93000 parts available Service and support information to maximize the use our! Series offers unprecedented scalability and integration systems and products are integrated into the advanced. 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V93000 Pin Scale 1600 digital card /WqB=W @ 0J ; fVK8 Evolutionary V93000 EXA Scale SoC test system at! Does not intend to, and expressly disclaims any duty to update or correct such information Kantor: spiuho uho.ac.id. In addition, a Wave Scale MX card is available at www.advantest.com Pin Scale 1600 digital card that directly the. Correct such information survey which works for you for massive multi-site applications - extending the power supply versatility the! It improves throughput while maintaining compatibility with the established MBAV8 instrument in characterization and volume manufacturing are for. Agilent -Verigy 93000 and PS 93000 parts available TMU for direct timing measurements on power signals $ @. High-Speed DACs and ADCs the most advanced semiconductor production lines in the materials on Web! The date issued test methods in C. Links are available for design-to-test conversion m $ @. 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